Omicron CP TD 1
Capacitance/dissipation factor testing device (tan delta)
Combined with the CPC 100, the CP TD1 measures the capacitance and dissipation factor (power factor) with laboratory precision.
This allows the insulation condition of transformers, generators and other parts of high-voltage systems to be tested according to IEEE 62 (C57.152), IEC 60076-1 and -3, as well as the CIGRE "Guide for Transformer Maintenance". As recommended in the CIGRE Guide, testing is performed at variable frequencies to better diagnose signs of ageing in insulation.
The portable test system (max. 29 kg per component) can also generate output voltages of up to 12 kV.
Key features
- Testing at variable frequencies - better diagnosis of signs of ageing in insulation
- Simple transport thanks to trolley - heaviest component just 29 kg
- Excellent suppression of mains frequency interference fields
- Automated testing – via PC using the Primary Test Manager software or via the user interface of the CPC 100 (includes testing templates)
- Reporting - Detailed analysis with trend displays and graphics
Applications
The following variables can be measured by extending the CPC 100 to include the CP TD1:
- Capacitance
- Dissipation factor tan δ (tan delta)
- Power factor cos φ
- Watt losses
- Power (effective power, apparent power, reactive power)
- Impedance (absolute value, phase, inductance, resistance, quality)
Omicron CPC 100
Electrical tests on transformers, current transformers, voltage transformers, grounding systems, lines and cables, and circuit breakers can be performed with the CPC 100.
The patented test system replaces several individual testing devices and offers new, innovative testing methods.
The CPC 100 is the base for multiple accessories. These facilitate further applications, such as tan delta measurements, as well as line and ground impedance measurements.
Key features
- Up to 800 A or 2000 V with up to 5 kVA over a frequency range of 15 Hz - 400 Hz or 400 A DC
- Excellent interference suppression facilitates measurement of small signals
- Easy to transport (just 29 kg) - Ideal for on-site testing
- Testing templates, automatically generated testing procedures and test reports
- Up to 2000 A or 12 kV through use of current or voltage amplifiers
Key features
Current transformers (CT)
- Ratio, burden and polarity
- Phase and magnitude error
- Excitation curve
- Winding resistance
- Secondary burden
- Dielectric withstand voltage (2 kV AC)
- CT circuit continuity
Voltage transformers (VT)
- Ratio, burden and polarity
- Phase and magnitude error
- Excitation curve
- Winding resistance
- Secondary burden
- Dielectric withstand voltage (2 kV AC)
- VT circuit continuity
Transformers
- Ratio
- Winding resistance
- Tap changer test
- Excitation current
- Short circuit impedance
- Transformer demagnetization
Lines and cables
- Impedance (k-factor)
- Transformer coupling
Grounding systems
- Ground impedance
- Step and touch voltages
Circuit breakers
- Contact resistance
Omicron FRAnalyzer
The FRAnalyzer (Frequency Response Analyzer) was developed for testing the integrity of power transformers after transportation or occurrence of high currents. The FRAnalyzer uses the SFRA principle (Sweep Frequency Response Analysis) and measures the electrical transfer function in a wide frequency range.
It detects winding defects and faults in the magnetic core - thereby helping to improve transformer reliability, reduce maintenance costs and prevent costly failures.
Key features
- Reproducible results thanks to innovative connection technology
- Extremely small and compact device (< 1.8 kg / 4 lbs)
- Wide dynamic measuring range (> 120 dB)
- Fast measurement times (around 30 seconds per measurement)
Applications
The FRAnalyzer is used for transformer testing, after:
- A short circuit event
- Transport
- Occurrence of high transient fault currents
- A significant change in the monitored values (e.g. combustible gases) or a safety shutdown
The following tests can also be performed:
- Routine transformer condition measurement
- Verification of unusual events determined during conventional testing
